This lecture covers the following topics: X-ray diffraction:
symmetry, space groups, geometry of diffraction, structure factors, phase
problem, direct methods, Patterson methods, electron density maps, structure
refinement, how to grow good crystals, powder methods, limits of X-ray
diffraction methods, and structure data bases.
Marcello Andreeta has compiled a
comprehensive book on crystallization processes blending the fundamental
concepts and practical insights it contains. It is intended for researchers from
various disciplines such that it not only covers the scientific principles
underlying crystallization but also presents new aspects of the subject. The
text may thus be used as an overall reference as well as an introductory guide
and, therefore, will be accessible for readers with different levels of
knowledge. Through recent breakthroughs and applications in crystallization
science, this book assembles the necessary knowledge and tools that readers may
deploy in charting critical areas of this field in materials science. The
approaches taken are, therefore interdisciplinary in nature, relevant both in
academic and in industrial contexts where efforts to collaborate and innovate in
crystallization research would improve much faster.
Lecture notes
by Dr. Peter Mueller on crystal structure analysis through X-ray diffraction
techniques include key topics like principles of symmetry and space groups,
geometry of diffraction, and computation of structure factors. The lecture goes
on to discuss problems such as the phase problem and direct and Patterson
techniques to solve it. It also encompasses electron density maps and refinement
of structures. Practical issues like growing good-quality crystals and powder
diffraction methods are addressed, besides the limitations of X-ray diffraction.
The notes are a treasure trove of knowledge on the basics of crystallography and
its applications combined with insight into structure databases.