This note explains
statistical modeling and the control of semiconductor fabrication processes and
plants. Topics covered includes: design of experiments, response surface
modeling, and process optimization, defect and parametric yield modeling,
process or device or circuit yield optimization, monitoring, diagnosis, and
feedback control of equipment and processes, and analysis and scheduling of
semiconductor manufacturing operations.
This
lecture note covers the following topics: Power semiconductor devices, SCR control circuits,
Controlled rectifier, Chopper, Inverters, Cycloconverter, Protection, Ratings
and failure of power electronics devices, Industrial electronics and
applications.
Author(s): Er Srikanta Sahu and Er Debashree Patnaik
This note explains
statistical modeling and the control of semiconductor fabrication processes and
plants. Topics covered includes: design of experiments, response surface
modeling, and process optimization, defect and parametric yield modeling,
process or device or circuit yield optimization, monitoring, diagnosis, and
feedback control of equipment and processes, and analysis and scheduling of
semiconductor manufacturing operations.
Understanding
semiconductor devices is critical in designing and improving many types of
systems. This note will give you an understanding of how devices work, the
critical issue and the key design tradeoffs in the devices.
Covered
topics are: operation of diodes and bipolar junction transistors, bipolar
devices to include the influence of recombination, the physical mechanisms
underlying the delays and speed limitations of the devices and to extract
equivalent circuit models for the devices.